• 32-frequency lock-in amplifier
  • 4 input ports, 2 output ports
  • Coherent signal synthesis and sampling
  • Oscilloscope - arb. waveform generator pair
  • Aux ports: 6 triggers, 4 analog out, digital I/O
  • Powerful graphical software and Python API.

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  • Software for using MLA with Atomic Force Microscopy
  • Compatible with most commercial AFMs
  • One-click cantilever calibration
  • Amplitude and phase imaging at all frequencies
  • Design your own multifrequency AFM mode
  • Approach-curves and stream recorder
  • Open file format, Gwyddion compatible.

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  • Software package for real-time and off-line nanomechanical analysis
  • Automized setup for ImAFM
  • Point-and-click force curves
  • Conservative and dissipative force analysis
  • Dynamic force quadrature curves
  • Map material properties with 3D visulaization
  • Numerous force models, user defined models.

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  • Software and hardware extension for imaging surface potential (contact potential difference)
  • Improved sensitivity over KPFM modes
  • No potential feedback (open loop)
  • Measure surface potential at different DC bias.

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  • Software for nanoscale frictional force imaging
  • Calibration of torsional resonance
  • Dynamic force quadrature analysis of frictional forces
  • Image high-speed friction, velocity up to several cm/sec
  • High spatial resolution, ~10 nm

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  • Signal access modules for connecting MLA to AFMs
  • Low signal distortion
  • Low noise pickup
  • Numerous models for various AFMs.

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